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| page 1 of 11 atmel corporation tel: (408) 441-0311 fax: (408) 436-4200 at-89c52 cmos flash micro controller reliability data* - 125 c dynamic operating life test - 200 c retention bake - 125 c dynamic operating life test (plastic) - 125 c retention bake (plastic) - 15 psig pressure pot - 85 c/85% relative humidity operating life test - extended temperature cycling - extended thermal shock - 131 c/85% relative humidity hast test *this report was generated from at-89c52 reliability testing. this data is applicable to the following device types due to same technology grouping as defined on mil-m-38535 appendix a: at-89c51 october 2006 2325 orchard parkway san jose ca. 95131
page 2 of 11 at-89c52 125 c dynamic operating life test lot date sample total number number code size ckt-hrs(k ) of failures 4d1707 4b9441 115 287.5 0 4d1707a 4d9505 164 410.0 0 5a1634 5a9517 143 357.5 0 failure rate toal device hours 1,055,000 device hours best estimate = 0.07% per 1,000 hours 50 c ambient extrapolation to 50 c.via arrehennius equation and activation energy of 0.5ev = 0.002% per 1,000 hours (23 fits) confidence estimate 60 = 0.003% per 1,000 hours 60% confidence (30 fits) 90 = 0.007% per 1,000 hours 90% confidence (74 fits) page 3 of 11 at-89c52 200 c data retention bake lot date sample total number number code size ckt-hrs(k) of failures 5c2822 5c9547 393 393.0 0 failure rate total device hours 393,000 device hours best estimate = 0.18% per 1000 hours 50 c ambient extrapolation to 50 c via arrhennius equation and activation energy of 0.5ev = 0.0006% per 1,000 hours (6 fits) confidence estimate 60 = 0.0008% per 1000 hours 60% confidence (8 fits) 90 = 0.002% per 1000 hours 90% confidence (20 fits) page 4 of 11 at-89c52 plastic package 125 c dynamic operating life test lot date sample total number number code size ckt-hrs(k) of failures 4c1407 4c9441 80 80.0 0 4d1707 4d9441 115 115.0 0 4c1521 4c9445 90 90.0 0 4d1047 4d9502 90 90.0 0 5c1951 5c9547 112 112.0 0 5c2822 5c9549 143 143.0 0 7d2904-3 7d9811 100 100.0 0 7d2904-1 7d9809 100 100.0 0 7d2857 7d9827 100 100.0 0 1g0215 1g0136 100 100.0 0 3h5470-1 3h0346 160 160.0 0 3h4406-1 3h0346 160 160.0 0 5h2255a 5h0544 100 100.0 0 5j3756-1 5j0603 100 100.0 0 5j3757-1 5j0603 80 80.0 0 failure rate total device hours 1,630,000 device hours best estimate = 0.04% per 1000 hours 50 c ambient extrapolation to 50 c via arrhennius equation and activation energy of 0.5ev = 0.001% per 1,000 hours (14 fits) confidence estimate 60 = 0.002% per 1000 hours 60% confidence (19 fits) 90 = 0.005% per 1000 hours 90% confidence (48 fits) page 5 of 11 at-89c52 plastic package 150 c retention bake lot date sample total number number code pkg size ckt-hrs(k) of failures 4c1521 4c9445 40 pdip 90 90.0 0 4c1471 4c9441 40 pdip 180 180.0 0 5c0873 5c9539 44 plcc 90 90.0 0 5b2672 5c9549 44 pqfp 98 98.0 0 5c2232 5c9547 40 pdip 78 78.0 0 e5n0011 5n9609 40 pdip 198 198.0 0 e5n0012 5n9609 40 pdip 204 204.0 0 6b0606 6b9629 44 pqfp 97 97.0 0 7l6199 7l9728 40 pdip 90 90.0 0 7m7419 7m9747 40 pdip 100 100.0 0 7d2904-1 7d9809 40 pdip 300 300.0 0 7d2904-3 7d9811 44 plcc 300 300.0 0 7d0457 7d9816 44 plcc 100 100.0 0 7n8211-2 7n9819 40 pdip 100 100.0 0 7n8211-1a 7n9820 44 plcc 100 100.0 0 7d2857 7d9827 44 plcc 100 100.0 0 9b0302n2 9b9926 44 plcc 100 100.0 0 0e2704a 0e0019 40 pdip 98 98.0 0 1e4922-1 1e0122 40 pdip 50 50.0 0 1e4928-1 1e0121 40 pdip 50 50.0 0 1e5508 1e0122 40 pdip 50 50.0 0 1g0215 1g0136 40 pdip 50 50.0 0 1j3032 1j0208 40 pdip 120 120.0 0 2h0645 2h0235 40 pdip 50 50.0 0 3e1871 3e0311 40 pdip 50 50.0 0 3g2215-1 3g0329 44 plcc 100 100.0 0 3h5470-1 3h0346 40 pdip 206 206.0 0 3h4406-1 3h0346 40 pdip 209 209.0 0 3h3137-1 3h0329 40 pdip 200 200.0 0 5h2255a 5h0544 40 pdip 100 100.0 0 page 6 of 11 at-89c52 plastic package 150 c retention bake lot date sample total number number code pkg size ckt-hrs(k) of failures 5j3756-1 5j0603 44 plcc 100 100.0 0 5j3757-1 5j0603 44 plcc 100 100.0 0 failure rate total device hours 3,867,000 device hours best estimate = 0.02% per 1000 hours 50 c ambient extrapolation to 50 c via arrhennius equation and activation energy of 0.5ev = 0.0003% per 1,000 hours (3 fits) confidence estimate 60 = 0.0004% per 1000 hours 60% confidence (3 fits) 90 = 0.001% per 1000 hours 90% confidence (9 fits) page 7 of 11 at-89c52 plastic package pressure pot test number of failure date code package type sample size at indicated hours (24) (48) (72) (96) 5b9538 44 plcc 154 0 0 0 0 5c9539 44 plcc 154 0 0 0 0 5c9547 40 pdip 127 0 0 0 0 5c9549 44 pqfp 90 0 0 0 0 5c9551 44 pdip 50 0 0 0 0 5d9614 44 plcc 154 0 0 0 0 6b9629 44 pqfp 45 0 0 0 0 7l9728 40 pdip 77 0 0 0 0 7m9747 40 pdip 154 0 0 0 0 7d9809 40 pdip 50 0 0 0 0 7d9811 40 pdip 100 0 0 0 0 7n9816 44 plcc 50 0 0 0 0 7n9819 40 pdip 50 0 0 0 0 7n9820 44 plcc 50 0 0 0 0 7d9827 44 plcc 50 0 0 0 0 9b9926 44 plcc 50 0 0 0 0 0a0019 40 pdip 50 0 0 0 0 1G0121 40 pdip 50 0 0 0 0 1e0122 40 pdip 50 0 0 0 0 1g0136 40 pdip 50 0 0 0 0 1j0208 40 pdip 50 0 0 0 0 2e0214 44 plcc 50 0 0 0 0 2h0235 40 pdip 50 0 0 0 0 3e0311 40 pdip 50 0 0 0 0 3g0329 44 plcc 100 0 0 0 0 3h0329 40 pdip 77 0 0 0 0 3h0346 40 pdip 154 0 0 0 0 5j0602 40 pdip 77 0 0 0 0 5j0603 44 plcc 154 0 0 0 0 page 8 of 11 at-89c52 plastic package 85 c/85% relative humidity operating life test lot date package sample number of failure number code type size at indicated hours (168) (500) (1000) 5c0873 5c9539 44 plcc 54 0 0 0 page 9 of 11 at-89c52 plastic package extended temperature cycling -65 c to +150 c plcc/tsop/soic/pdip -55c to +125c cbga date pkg sample number number code type size of cycles of failures 5b9538 44 plcc 77 1000 0 7d9816 44 plcc 50 1000 0 7d9827 44 plcc 50 1000 0 9b9926 44 plcc 50 1000 0 0a0019 40 pdip 50 1000 0 1G0121 40 pdip 50 1000 0 3g0320 44 plcc 100 1000 0 3h0346 40 pdip 77 1000 0 5j0602 40 pdip 77 1000 0 5j0603 44 plcc 77 1000 0 page 10 of 11 at-89c52 plastic package extended thermal shock -55 c to +125 c date pkg sample number number code type size of cycles of failures 5c9539 44 plcc 77 1000 0 5b2672 44 pqfp 44 1000 0 6a9621 44 pqfp 77 1000 0 6b9629 44 pqfp 77 1000 0 7l9728 40 pdip 77 1000 0 7m9747 40 pdip 77 1000 0 page 11 of 11 at-89c52 plastic package 131 c/85% relative humidity hast test lot date pkg sample number of failures number code type size at indicated hours (100) 7d2904-3 7d9811 40 plcc 50 0 7d0457 7d9816 44 plcc 50 0 7d2857 7d9827 44 plcc 50 0 9b0302n2 9b9926 44 plcc 50 0 1e5508 1e0122 40 pdip 50 0 1j3032 1j0208 40 pdip 50 0 2h0645 2h0235 40 pdip 50 0 3e1871 3e0311 40 pdip 50 0 3h3137-1 3h0329 40 pdip 77 0 3h4406-1 3h0346 40 pdip 77 0 3h5470-1 3h0346 40 pdip 77 0 5j3756-1 5j0603 44 plcc 77 0 5j3757-1 5j0603 44 plcc 77 0 |
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